Bruker Announces Acquisition of Field-Portable Platform for Fast and Universal Immunoassay-Detection of Bacteria, Viruses and Toxins

LEIPZIG, Germany, August 1st, 2017 — Bruker today announced the closing of a technology platform and product line acquisition to further expand its range of bacterial, viral and toxin detection solutions for homeland security bio-detection and for selected microbiology applications. Financial details were not disclosed.
The acquired assets include intellectual property, a field-portable, electrochemical chip-based detection instrument and associated consumable kits for on-site, fast identification of selected bacteria, viruses and toxins.
Detection and identification of up to 6 bio-threats per assay chip occurs typically within 20 minutes, with excellent sensitivities and without any prior culturing steps for bacteria. The immunoassay kits, which Bruker now can offer for bio-detection and homeland security, include:
Biothreat Test: Bacillus anthracis, Yersinia pestis, Francisella tularensis, Brucella species, Burkholderia mallei/pseudomallei, Orthopox viruses (smallpox);
Toxin Test I: Botulinum Toxins A, B, F; Staphylococcal Enterotoxin B; Ricin;
Toxin Test II: Botulinum Toxin C, D, E; Staphylococcal Enterotoxin A; Abrin;
The acquired instrument platform, the portable Bio-Detector integrated (pBDi), is ready for immediate commercial launch. Unlike other PCR-based field methods, the unique multiplex ELISA-based (enzyme-linked immunosorbent assay) detection with a novel electrochemical chip readout, allows rapid on-site identification of various bio-threats, including toxins, with very high sensitivity.
Developed for ease of use by non-scientific personnel, the pBDi can even be operated while working in protective gear under field conditions. Fully portable and operating from internal batteries, the pBDi can be used in ‘hot zones’.
Dr. Thomas Elssner, Bio-Detection Manager at the Bruker Detection division, commented: “We are very excited to offer the pBDi as an easy-to-use and robust detection system that was specifically designed for field applications, and which dramatically decreases the time and effort to assess the seriousness of bio-threat incidents. Our new platform also allows the flexible development of new assays and consumables to address emerging threats.”
Dr. Wolfgang Pusch, Executive Vice President of Microbiology & Diagnostics at Bruker Daltonics, added: “The new pBDi system leverages our recently acquired capabilities in monoclonal antibody production to enable new, fieldable immunoassay workflows for fast toxin, viral and bacterial detection, in the future also in clinical and food microbiology. The pBDi platform is a valuable expansion of our microbiology portfolio, consisting of the MALDI Biotyper for broad and fast microbial identification, the IR Biotyper for infection control workflows, and the Fungiplex and Carbaplex real-time PCR assays for rapid molecular testing.”

About Bruker Corporation (NASDAQ: BRKR)

For more than 55 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance scientific instruments and high-value analytical and diagnostic solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels. In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical phenomics and proteomics research, clinical microbiology and molecular pathology research.
Investor Contact:
Miroslava Minkova
Bruker Head of Investor Relations
T: +1 (978) 663–3660, ext. 1479
E: miroslava.minkova@bruker.com
Media and Technical Contact:
Dr. Thomas Elssner
Bruker Detection Division, Bio-Detection
T: +49 (0)341-2431-366
E: Thomas.Elssner@bruker.com

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Source: Bruker

Bruker Announces Updated D2 PHASERTM Benchtop X-ray Diffraction (XRD) System with LYNXEYE XE-TTM One-dimensional Detector

BIG SKY, Montana (USA) – July 31st, 2017 – At the 66th annual Denver X-ray Conference, Bruker announces the availability of the LYNXEYE XE-T next generation one-dimensional compound silicon strip detector, further enhancing the performance of its popular D2 PHASERTM benchtop X-ray diffraction (XRD) system.
The versatile hardware of the updated D2 PHASER combined with the Bruker DIFFRAC.SUITETM software allows users the flexibility to create automated push-button methods for ease of use and to customize measurement conditions and configurations for optimized data quality.  This benchtop system needs no water cooling or special power requirements, making the D2 PHASER unmatched in its ability to bring powder XRD to any laboratory.
The LYNXEYE XE-T detector features four times better energy resolution than traditional silicon strip detectors in order to efficiently remove unwanted radiation, such as fluorescence, K-beta radiation, and bremsstrahlung background, without meaningful losses in one-dimensional detection speed.
According to Arnt Kern, the Bruker AXS Product Line Manager for XRD: “The D2 PHASER with LYNXEYE XE-T sets a new standard for benchtop-class high-speed data collection, outstanding peak to background ratio, and data quality.”

About Bruker Corporation  

For more than 55 years, Bruker has enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life.  Bruker’s high-performance scientific research instruments and high-value analytical and diagnostic solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels.  
In close cooperation with our customers, Bruker is enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical research, microbiology and molecular diagnostics. 

Media Contact: 

Dr. Heiko Ress
Bruker AXS Director Marketing Communications
T: +(49) 721 50997-0
E: heiko.ress@bruker.com

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Source: Bruker

Multiple Leading Logic and Foundry Customers Order Bruker X-Ray Defect Inspection Systems

SAN FRANCISCO, California – July 11, 2017 – At SEMICON West 2017, Bruker’s Semiconductor Division today announced that leading multiple semiconductor manufacturers have ordered JVSensus-600E X-ray Diffraction Imaging Systems for in-line wafer monitoring of crystalline defects. The JVSensus-600E tool is equipped with both high-speed and high-resolution X-ray diffraction imaging (XRDI) measurement capabilities for detecting and classifying a wide range of crystalline defects induced by high-stress processes, such as fast annealing and CMP, or by poor wafer handling. The JVSensus system allows defects to be identified prior to annealing, which is often the critical step that leads to wafer breakage and severe yield loss. By detecting defects early in the process, semiconductor manufacturers can quickly identify the root cause of processes causing wafer breakage and reduce yield loss.
“We are delighted to have been selected by industry-leading customers to provide defect inspection systems for their production yield improvement,” said David V. Rossi, President of the Bruker Semiconductor Division. “We see these shipments as further validation of the value that early detection of critical defects brings to our customers in reduction of wafer breakage.”
“As the industry utilizes more aggressive steps within more advanced technology nodes, such as fast annealing strategies, new non-visual defect detection challenges arise,” added Isaac Mazor, Vice President and General Manager of Bruker’s X-ray Semiconductor business. “The JVSensus-600E system is capable of detecting a wide range of crystalline defects using X-ray diffraction imaging technique, and is optimised for both blanket and pattern wafers on a single system. This allows a fab to efficiently ramp up processes and quickly identify crystalline defects on product wafers to minimize yield loss from wafer breakage in their production line.”

About JVSensus-600E

JVSensus-600E is a production-worthy XRDI system for detecting and classifying crystalline defects in single crystal wafers, and can be used for both in-fab process development and production monitoring. The tool is able to detect a wide range of crystalline defects that may be induced mechanically or through thermal treatments. It is capable of performing defect recognition analysis on the images to extract defect parameters, such as their size and their location across the wafer, as well as present the results as a standardized defect map compatible with the latest KLARF format. Additionally, with its high-resolution cross section capability, JVSensus-600E can also provide information on whether the defects appear on the front or the backside of the wafer, which is of prime importance in finding the root cause of the crystalline defects. XRDI is a technique that allows the user to detect non-visual defects on blanket, patterned and metallised wafers that would go undetected by existing optical inspections.
Media Contact:
Paul Ryan
Bruker Semiconductor Division
T: +44 191 332 4812
E: Paul.Ryan@bruker.com

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Source: Bruker

In Memoriam

Mr. van Ingen served on the Company’s Board from 2012 to June 2017, and as a director of Bruker Energy & Supercon Technologies, Inc., a wholly-owned subsidiary of the Company, from 2009 to 2013. The Company’s Board and management are extremely grateful for Mr. van Ingen’s guidance and leadership over the years and extend their deepest condolences to his family.
Chris van Ingen served as an advisor to various life sciences and analytical technology companies since 2007, including Bruker and certain of its subsidiaries from 2008 until 2011. Mr. van Ingen also served as a director of Bruker Energy & Supercon Technologies, Inc. from 2009 through March 2013, including as chairman of the board of directors and member of the Compensation Committee from 2010 to March 2013. From 2001 until October 2007, he was President of the Life Sciences and Chemical Analysis Group at Agilent Technologies, Inc. Prior to joining Agilent, Mr. van Ingen was Vice President of Sales and Marketing at Hewlett Packard’s Chemical Analysis Group and held other senior management positions at Hewlett Packard’s Avondale Division and Netherlands Country Operation. Mr. van Ingen also served on the board of directors of Trinean N.V., a privately-held life sciences instrumentation company based in Belgium and on the board of directors of Lifeonics Limited, a privately-held life sciences company based in New Zealand. Mr. van Ingen previously served as chairman of the board of directors and as a member of Audit Committee of Accelrys, Inc. from 2010 to 2014 and served on the board of directors and Compensation Committee of Promega Corporation, a privately-held biotechnology company, from 2010 to 2015. He also served on the board of directors and Compensation Committee of ProteinSimple, a privately-held life sciences company, from March 2014 until July 2014. Mr. van Ingen held a B.S. degree in analytical chemistry. Mr. van Ingen brought to the board financial, sales and marketing, and general management experience in the analytical and life sciences industries, as well as significant experience in corporate governance, strategic planning and public company compensation matters. Most recently, Mr. van Ingen served on the Company’s Audit Committee and Nominating Committee.

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Source: Bruker

Bruker Optics Newsletter – July 2017

Webinar about VERTEX Vacuum FTIR Spectrometers for High-End Applications * Solutions for the Meat Processing Industry * Microplastics – IR Microscopy Helps to Research a Gobal Problem * verTera – Two Techniques, One Spectrometer, Highest Flexibility * Raman Microscopy for Pharmaceutical QC and R&D: Efficient and Validated * Visit us at Oils + Fats

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Bruker Optik Newsletter – Juni 2017

Webinar über VERTEX Vakuum-FT-IR-Spektrometer für High-End-Forschungsanwendungen * Bruker Optik Anwendertreffen 2017 * FT-NIR-spektroskopische Lösungen für die fleischverarbeitende Industrie * Mikroplastik – IR-Mikroskopie hilft bei der Erforschung eines globalen Problems * Raman-Mikroskopie für pharmazeutische QC und F&E: Effizient und validiert * verTera – zwei Techniken, ein Spektrometer, höchste Flexibilität * Besuchen Sie uns auf der LAB SUPPLY * Besuchen Sie uns auf dem Danube Vlata Sava Polymer Meeting (DVSPM) * Besuchen Sie uns auf der Expopharm 2017 * Besuchen Sie uns auf der Oils + Fats

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Source: Bruker